X-ray diffraction analysis of powder samples is the most effective and precise analytical method for determining the quantitative mineral composition of a multi-mineral sample. The method is based on the Nobel Prize-winning discovery of the diffraction of X-rays at the so-called "lattice planes" of crystals (Max von Laue, 1914). Physically, there is a relationship between the wavelength "λ" of the radiation used (e.g. copper anode with λCu = 1.54 Å), the lattice plane spacing "d" of a crystalline material and the diffraction angle "θ" (Bagg's equation). Analytically, this physical relationship forms the basis for the measurement of mineral-containing powder samples in X-ray diffractometers. The collected data are visualised and evaluated in an X-ray diffractogram, where the expertise of the user plays the decisive role. In the past century, the technology of the measurement method as well as the numerical basis of the evaluation (Rietveld refinement) has been continuously developed, but the evaluation of the diffractograms is still done manually.